Code coverage analysis using high-level decision diagrams [Electronic resource]
author
Raik, Jaan
Reinsalu, Uljana
Ubar, Raimund-Johannes
Jenihhin, Maksim
Ellervee, Peeter
statement of authorship
Jaan Raik, Uljana Reinsalu, Raimund Ubar, Maksim Jenihhin, Peeter Ellervee
source
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
location of publication
[S.l.]
publisher
IEEE
year of publication
2008
pages
p. 201-207 : ill. [CD-ROM]
ISBN
978-1-4244-2277-7
notes
Bibliogr.: 13 ref