Functional built-in self-test for processor cores in SoC
author
Ubar, Raimund-Johannes
Indus, Viljar
Kalmend, Oliver
Evartson, Teet
Orasson, Elmet
statement of authorship
Raimund Ubar, Viljar Indus, Oliver Kalmend, Teet Evartson, Elmet Orasson
source
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
location of publication
[S.l.]
publisher
IEEE Computer Society
year of publication
2012
pages
p. 1-4 : ill
conference name, date
30th IEEE NORCHIP Conference, November 12-14, 2012
conference location
Copenhagen, Denmark
url
https://ieeexplore.ieee.org/document/6403148
subject term
protsessorid
testid
testimine
ISBN
978-1-4673-2223-2
notes
Bibliogr.: 13 ref
language
inglise