SiC-diodes forward surge current failure mechanisms : experiment and simulation
author
Udal, Andres
Velmre, Enn
statement of authorship
A.Udal and E.Velmre
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
Vol. 37, 10/11
year of publication
1997
pages
p. 1671-1674
url
https://doi.org/10.1016/S0026-2714(97)00136-4
subject term
dioodid
simulatsioon
ISSN
0026-2714
Open Access
Open Access
TalTech department
elektroonikainstituut
language
inglise