Hierarchical approaches to test generation and fault simulation

statement of authorship
Ubar, R.
journal volume number month
3
year of publication
pages
p. 204
ISSN
1563-0064
notes
Special issue: Proceedings of East-West Design & Test Conference (EWDTC’03): Yalta, Alushta, Crimea, Ukraine, September 17-21, 2003
language
inglise
Ubar, R.-J. Hierarchical approaches to test generation and fault simulation // Radioelectronics and informatics (2003) 3, p. 204.