Test generation for finite state machines
statement of authorship
R.Ubar, M.Brik
location of publication
[Tallinn]
year of publication
pages
p. 233-236: ill
ISBN
9985-59-026-0
notes
Bibl. 5 ref
Ubar, R., Brik, M. Test generation for finite state machines // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 233-236: ill.