Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
author
Sangwongwanich, Ariya
Zhou, D.
Liivik, Elizaveta
Blaabjerg, Frede
statement of authorship
A. Sangwongwanich, D. Zhou, E. Liivik, F. Blaabjerg
source
Microelectronics reliability
journal volume number month
vol. 88–90
year of publication
2018
pages
p. 1003-1007
url
https://doi.org/10.1016/j.microrel.2018.06.094
subject term
pooljuhtmaterjalid
temperatuuri toime
energiatõhusus
digitaalsignaalid
jõuelektroonika
päikeseelemendid
keyword
mission profile
power devices
thermal stress
solar irradiance
reliability prediction
sampling rate
power electronics
photovoltaic systems
ISSN
0026-2714
notes
Bibliogr.: 18 ref
TTÜ department
elektroenergeetika ja mehhatroonika instituut
language
inglise