An external test approach for network-on-a-chip switches
author
Raik, Jaan
Govind, Vineeth
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
source
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
location of publication
Kolkata
publisher
IEEE
year of publication
2011
pages
p. 185-190 : ill
subject term
arvutivõrgud
integraallülitused
testimine
ISBN
978-93-80813-12-7
notes
Bibliogr.: 14 ref
language
inglise