Optimization of the store-and-generate based built-in self-test
author
Ubar, Raimund-Johannes
Jervan, Gert
Kruus, Helena
Orasson, Elmet
Aleksejev, Igor
statement of authorship
R.Ubar, G.Jervan, H.Kruus, E.Orasson, I.Aleksejev
source
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2006
pages
p. 199-202 : ill
conference name, date
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006
conference location
Tallinn, Estonia
subject term
integraallülitused
testimine
optimeerimine
ISBN
1-4244-0414-2
notes
Bibliogr.: 17 ref
TalTech department
arvutitehnika instituut
language
inglise