full record print

Comparison of two approaches to improve functional BIST fault coverage

author
statement of authorship
Sergei Kostin, Raimund Ubar, Maksim Gorev, Gunnar Mägi
source
location of publication
Tallinn
publisher
year of publication
pages
p. 105-108 : ill
conference name, date
2014 14th Biennial Baltic Electronics Conference, October 6-8, 2014
conference location
Tallinn University of Technology
ISSN
1736-3705
ISBN
978-9949-23-672-5
notes
Bibliogr.: 26 ref
TTÜ department
language
inglise
subject term
keyword
functional BIST
hybrid BIST
design for testability
controllability
test point insertion
Kostin, S., Ubar, R., Gorev, M., Mägi, G. Comparison of two approaches to improve functional BIST fault coverage // BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2014. p. 105-108 : ill.