Rastello, M. L., Degiovanni, I. P., Kübarsepp, T. et al.

full record print

Metrology for industrial quantum communications : the MIQC project

author

Rastello, Maria Luisa

Degiovanni, I. P.

Kübarsepp, Toomas

statement of authorship

M.L. Rastello, I.P. Degiovanni, ... T. Kubarsepp, ... [et al.]

source

Metrologia

journal volume number month

Vol. 51, 6

year of publication

2014

pages

p. S267-S275 : ill

ISSN

0026-1394

notes

Bibliogr.: 29 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

metroloogia

kvantkrüptograafia

kvantinformatsioon

keyword

metrology

quantum cryptography

quantum communication

TalTechi üksused

TTÜ department

mehhatroonikainstituut

Rastello, M. L., Degiovanni, I. P., Kübarsepp, T. et al. Metrology for industrial quantum communications : the MIQC project // Metrologia (2014) Vol. 51, 6, p. S267-S275 : ill.