Study on power losses of the full soft-switching current-fed DC/DC converter with Si and GaN devices
statement of authorship
Andrii Chub, Jacek Rabkowski, Andrei Blinov, Dmitri Vinnikov
location of publication
[S.l.]
publisher
year of publication
pages
p. 13-18
conference name, date
41st Annual Conference of the IEEE Industrial Electronics Society (IECON 2015), November 9-12, 2015
conference location
Yokohama, Japan
keyword
Si MOSFET
wide band gap semiconductor devices
ISBN
978-1-4799-1761-7
TTÜ department
language
inglise
Chub, A., Rabkowski, J., Blinov, A., Vinnikov, D. Study on power losses of the full soft-switching current-fed DC/DC converter with Si and GaN devices // IECON 2015 - Yokohama : 41st Annual Conference of the IEEE Industrial Electronics Society : November 9-12, 2015, Pacifico Yokohama, Yokohama, Japan. [S.l.] : IEEE, 2015. p. 13-18.