Pfeifer, P., Raik, J., Jenihhin, M., Ubar, R., Pliva, Z.

full record print

Measuring and identifying aging-critical paths in FPGAs

author

Pfeifer, Petr

Raik, Jaan

Jenihhin, Maksim

Ubar, Raimund-Johannes

Pliva, Zdenek

statement of authorship

Petr Pfeifer, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Zdenek Pliva

source

MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France

location of publication

[S.l.]

publisher

COST

year of publication

2015

pages

p. 56-61 : ill

conference name, date

4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, March 13, 2015

conference location

Grenoble, France

notes

Bibliogr.: 14 ref

TTÜ department

arvutitehnika instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

väliprogrammeeritav loogika

diagnostika (tehnika)

keyword

aging

FPGA

critical path

logic

LUT

BRAM

Pfeifer, P., Raik, J., Jenihhin, M., Ubar, R., Pliva, Z. Measuring and identifying aging-critical paths in FPGAs // MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France. [S.l.] : COST, 2015. p. 56-61 : ill.