Embedded instrumentation toolbox for screening marginal defects and outliers for production
statement of authorship
Sergei Odintsov, Artur Jutman, Sergei Devadze, Igor Aleksejev
source
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
location of publication
Piscataway
publisher
year of publication
pages
p. 336-334 : ill
conference name, date
IEEE AUTOTESTCON 2017, September 11-14, 2017
conference location
Schaumburg, USA
ISBN
978-1-5090-4922-6
notes
Bibliogr.: 15 ref
TalTech department
language
inglise
subject term
TalTech subject term
sardkontroller
keyword
operating margin
no fault found
NFF
FPGA-centric test
high-speed serial link test
memory interconnect test
bit-error rate test
DDR4 interconnect test
Odintsov, S., Jutman, A., Devadze, S., Aleksejev, I. Embedded instrumentation toolbox for screening marginal defects and outliers for production // IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings. Piscataway : IEEE, 2017. p. 336-334 : ill.