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Towards multidimensional verification : where functional meets non-functional

author
Jenihhin, Maksim
Lai, Xinhui
Ghasempouri, Tara
Raik, Jaan
statement of authorship
Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri, Jaan Raik
source
2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore
location of publication
[S.l.]
publisher
IEEE
year of publication
2018
pages
7 p. : ill
conference name, date
2018 IEEE Nordic Circuits and Systems Conference (NORCAS), 30-31 October 2018
conference location
Tallinn
url
https://doi.org/10.1109/NORCHIP.2018.8573495
subject term
riistvara
keyword
extra-functional verification
functional verification
survey
taxonomy
security verification
reliability verification
power verification
timing verification
ISBN
978-1-5386-7656-1
notes
Bibliogr.: 71 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Jenihhin, M., Lai, X., Ghasempouri, T., Raik, J. Towards multidimensional verification : where functional meets non-functional // 2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore. [S.l.] : IEEE, 2018. 7 p. : ill. https://doi.org/10.1109/NORCHIP.2018.8573495