Towards multidimensional verification : where functional meets non-functional

vastutusandmed
Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri, Jaan Raik
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
7 p. : ill
konverentsi nimetus, aeg
2018 IEEE Nordic Circuits and Systems Conference (NORCAS), 30-31 October 2018
konverentsi toimumispaik
Tallinn
ISBN
978-1-5386-7656-1
märkused
Bibliogr.: 71 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Lai, X., Ghasempouri, T., Raik, J. Towards multidimensional verification : where functional meets non-functional // 2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore. [S.l.] : IEEE, 2018. 7 p. : ill. https://doi.org/10.1109/NORCHIP.2018.8573495