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Application specific true critical paths identification in sequential circuits

author
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Adeboye Stephen Oyeniran
source
location of publication
Piscataway
publisher
year of publication
pages
p. 299-304 : ill
conference name, date
25th IEEE International Symposium on On-Line Testing and Robust System Design, July 1-3, 2019
conference location
Rhodes Island, Greece
url
ISSN
1942-9401
1942-9398
ISBN
978-1-7281-2490-2
978-1-7281-2491-9
notes
Bibliogr.: 25 ref
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J., Devadze, S., Oyeniran, A. Application specific true critical paths identification in sequential circuits // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece. Piscataway : IEEE, 2019. p. 299-304 : ill. https://doi.org/10.1109/IOLTS.2019.8854442