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journal article EST
/
journal article ENG
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
Journal metrics at Scopus
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journal article EST
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journal article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article EST
/
book article ENG
Special session : AutoSoC - a suite of open-source automotive SoC benchmarks
Silva, Felipe Augusto da
;
Bagbaba, Ahmet Cagri
;
Ruospo, Annachiara
;
Jenihhin, Maksim
2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings
2020
/
9 p. : ill
https://doi.org/10.1109/VTS48691.2020.9107599
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book article EST
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Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
Number of records 2, displaying
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keyword
14
1.
ISO 26262
2.
ISO 13940
3.
ISO 14001
4.
ISO 179 Charpy impact toughness
5.
ISO 19650
6.
iso 20776-1:2006
7.
ISO 27001
8.
ISO 27447
9.
ISO 9001
10.
ISO/IEC 15504
11.
iso-conversion
12.
ISO-fire exposure
13.
ISO‐fire exposure
14.
ISO-standards
subject term
2
1.
ISO 9000 seeria standardid
2.
ISO standardid
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