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Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits

author
Pagliarini, Samuel Nascimento
Benites, Luis
Martins, Mayler
Rech, Paolo
Kastensmidt, Fernanda
statement of authorship
Samuel Pagliarini, Luis Benites, Mayler Martins, Paolo Rech, Fernanda Kastensmidt
source
publisher
journal volume number month
vol. 68, 5
year of publication
pages
p. 1045-1053
url
ISSN
0018-9499
notes
Bibliogr.: 23 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
language
inglise
Reserch Group
Centre for hardware security
Pagliarini, S., Benites, L., Martins, M., Rech, P., Kastensmidt, F. Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits // IEEE transactions on nuclear science (2021) vol. 68, 5, p. 1045-1053. https://doi.org/10.1109/TNS.2021.3070643