On antagonism between side-channel security and soft-error reliability in BNN inference engines
statement of authorship
Xinhui Lai, Thomas Lange, Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin
source
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
publisher
year of publication
pages
p. 1-6
conference name, date
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC), 04-07 October 2021
conference location
Singapore
ISSN
2324-8440
ISBN
978-1-6654-2614-5
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
Binarized Neural Network (BNN)
soft-error reliability
logical de-rating
Differential Power Analysis (DPA)
classifier
Lai, X., Lange, T., Balakrishnan, A., Alexandrescu, D., Jenihhin, M. On antagonism between side-channel security and soft-error reliability in BNN inference engines // IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC). : IEEE, 2021. p. 1-6.