Side-channel attacks on triple modular redundancy schemes
statement of authorship
Felipe Almeida, Levent Aksoy, Jaan Raik, and Samuel Pagliarini
source
2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings
publisher
year of publication
pages
p. 79-84 : ill
conference name, date
2021 IEEE 30th Asian Test Symposium ATS 2021, 22-25 November 2021
conference location
Matsuyama, Ehime, Japan
subject term
WOS
kvartiil
category (general)
category (sub)
keyword
ISSN
2377-5386
ISBN
978-1-6654-4051-6
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Almeida, F., Aksoy, L., Raik, J., Pagliarini, S. Side-channel attacks on triple modular redundancy schemes // 2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings. : IEEE, 2021. p. 79-84 : ill.