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A novel fault-tolerant logic style with self-checking capability

author
statement of authorship
Taheri, Mahdi, Sheikhpour, Saeideh, Mahani, Ali, Jenihhin, Maksim
source
location of publication
Piscataway, New Jersey
publisher
year of publication
pages
art. 183305 : ill
conference name, date
28th IEEE International Symposium on On-Line Testing and Robust System Design, 12-14 Sept. 2022
conference location
Torino, Italy
url
ISBN
978-166547355-2
notes
Bibliogr.: 27 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
Digital circuits
error detection
logic level
self-checking
Scopus
Scopus
classifier
3.1
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Taheri, M., Sheikhpour, S., Mahani, A., Jenihhin, M. A novel fault-tolerant logic style with self-checking capability // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Piscataway, New Jersey : IEEE, 2022. art. 183305 : ill. https://doi.org/10.1109/IOLTS56730.2022.9897818