Incorporating service type in aging failure model of high voltage circuit breaker
statement of authorship
Sajjad Asefi, Jako Kilter, Mart Landsberg
source
2023 27th International Conference Electronics : proceedings
location of publication
Danvers
publisher
year of publication
pages
5 p
conference name, date
IEEE 27th International Conference ELECTRONICS 2023, 19th–21th June, 2023
conference location
Kaunas, Lithuania
name of the person
notes
Bibliogr.: 18 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
classifier
Reserch Group
Asefi, S., Kilter, J., Landsberg, M. Incorporating service type in aging failure model of high voltage circuit breaker // 2023 27th International Conference Electronics : proceedings. Danvers : IEEE, 2023. 5 p. https://doi.org/10.1109/IEEECONF58372.2023.10177602