Lille, H., Kõo, J., Gregor, A., Ryabchikov, A., Sergejev, F., Traksmaa, R., Kulu, P.

full record print

Comparison of curvature and X-Ray methods for measuring of residual stresses in hard PVD coatings

author

Lille, Harri

Kõo, Jakub

Gregor, Andre

Ryabchikov, Alexander

Sergejev, Fjodor

Traksmaa, Rainer

Kulu, Priit

statement of authorship

Harri Lille, Jakub Kõo, Andre Gregor, Alexander Ryabchikov, Fjodor Sergejev, Rainer Traksmaa, Priit Kulu

source

Materials science forum

journal volume number month

Vol. 681, Residual Stresses VIII

year of publication

2011

pages

p. 455-460

series

Materials Science Forum

ISSN

1662-9752

language

inglise

Märksõnad ja võtmesõnad

subject term

kattematerjalid

pindamine

õhukesed kiled

röntgenikiirgus

difraktsioon

keyword

curvature method

nc-(AlTi) N/a-Si3N4

PVD coating

thin film

TiAlN

TiCN

TiN

X-Ray Diffraction (XRD)

Lille, H., Kõo, J., Gregor, A., Ryabchikov, A., Sergejev, F., Traksmaa, R., Kulu, P. Comparison of curvature and X-Ray methods for measuring of residual stresses in hard PVD coatings // Materials science forum (2011) Vol. 681, Residual Stresses VIII, p. 455-460.