On-chip sensors data collection and analysis for SoC health management
author
statement of authorship
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
publisher
year of publication
pages
6 p
conference name, date
36th IEEE InternationalSymposium on Defect andFault Tolerancein VLSIandNanotechnology Systems (DFT), 3-5 October 2023
conference location
Juan-les-Pins, France
ISSN
2765-933X
ISBN
979-8-3503-1500-4
notes
Bibliogr.: 15 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
modern system-on-chips (SoCs)
multi-processor system-on-chips (MPSoCs)
on-chip sensor
health map
classifier
Shibin, K., Jenihhin, M., Jutman, A., Devadze, S., Tsertov, A. On-chip sensors data collection and analysis for SoC health management // 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). : IEEE, 2023. 6 p.