Failure prediction of power devices under reverse surge current conditions
author
statement of authorship
Boris Freydin, Enn Velmre, and Andres Udal
source
ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992
location of publication
Tokyo
publisher
year of publication
pages
p. 118-123: fig
conference name, date
The 4th International Symposium on Power Semiconductor Devices, May 1992
conference location
Waseda University, Tokyo
subject term
keyword
Surges
Poisson equations
Electronic packaging thermal management
Semiconductor device packaging
Charge carrier processes
Freydin, B., Velmre, E., Udal, A. Failure prediction of power devices under reverse surge current conditions // ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992. Tokyo : IEEE, 1992. p. 118-123: fig.