Kask, E., Grossberg, M., Josepson, R., Salu, P., Timmo, K., Krustok, J.

full record print

Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy

author

Kask, Erkki

Grossberg, Maarja

Josepson, Raavo

Salu, Pille

Timmo, Kristi

Krustok, Jüri

statement of authorship

E. Kask, M. Grossberg, R. Josepson, P. Salu, K. Timmo, J. Krustok

source

Materials science in semiconductor processing

journal volume number month

Vol. 16, 3

year of publication

2013

pages

p. 992-996 : ill

ISSN

1369-8001

notes

Bibliogr.: 22 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

vaseühendid

fotoluminestsents

fluorestsentsspektroskoopia

keyword

Cu2ZnSnSe4

Cu2ZnSn(Se0.75S0.25)4

admittance spectroscopy

photoluminescence spectroscopy

defects

TalTechi üksused

TTÜ department

materjaliteaduse instituut

füüsikainstituut

Kask, E., Grossberg, M., Josepson, R., Salu, P., Timmo, K., Krustok, J. Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy // Materials science in semiconductor processing (2013) Vol. 16, 3, p. 992-996 : ill.