Gramatova, E., Bezakova, J., Cibakova, T.*

Test pattern generation at the behavioral level from VHDL circuit description containing several processes

author

Gramatova, Elena

Bezakova, Jana

Cibakova, Tatiana

statement of authorship

Elena Gramatova, Jana Bezakova, Tatiana Cibakova

source

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1996

pages

p. 145-148

ISBN

9985-59-026-0

notes

Bibl. 14 ref

Gramatova, E., Bezakova, J., Cibakova, T.* Test pattern generation at the behavioral level from VHDL circuit description containing several processes // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 145-148.