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Rakowski, Michal (author)
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book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
https://ieeexplore.ieee.org/document/4669309
book article
2
book article
Layout to logic defect analysis for hierarchical test generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Rakowski, Michal
Proceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland
2007
/
p. 35-40 : ill
http://dx.doi.org/10.1109/DDECS.2007.4295251
book article
Number of records 2, displaying
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author
20
1.
Rakowski, Michal
2.
Besterci, Michal
3.
Czub, Michal
4.
Dzielinski, Michal
5.
Hetman, Michal
6.
Knapek, Michal
7.
Krassowski, Michal
8.
Kubajko, Michal
9.
Kubjako, Michal
10.
Mergl, Michal
11.
Mračko, Michal
12.
Petr, Michal
13.
Preisner, Michal
14.
Rolak, Michal
15.
Rubaszek, Michal
16.
Słowinski, Michal
17.
Straka, Michal
18.
Zaton, Michal
19.
Wozniakiewicz, Michal
20.
Šereš, Michal
name of the person
2
1.
Besterci, Michal, 1937-
2.
Michal, Kristen
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