Test driven domain modelling
statement of authorship
Gunnar Piho, Jaak Tepandi, Marko Parman, Viljam Puusep and Mart Roost
location of publication
[S.l.]
publisher
year of publication
pages
p. 576-581
conference name, date
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011
conference location
Opatija, Croatia
ISBN
978-953-233-067-0
978-1-4577-0996-8
notes
Bibliogr.: 25 ref
language
inglise
subject term
keyword
domain analysis and engineering
domain model and domain modelling
test driven development
test driven modelling
verification and validation
Piho, G., Tepandi, J., Parman, M., Puusep, V., Roost, M. Test driven domain modelling // MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings. [S.l.] : MIPRO, 2011. p. 576-581.