Test driven domain modelling
statement of authorship
Gunnar Piho, Jaak Tepandi, Marko Parman, Viljam Puusep and Mart Roost
location of publication
[S.l.]
publisher
year of publication
pages
p. 576-581
conference name, date
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011
conference location
Opatija, Croatia
keyword
domain analysis and engineering
domain model and domain modelling
test driven development
test driven modelling
verification and validation
ISBN
978-953-233-067-0
978-1-4577-0996-8
notes
Bibliogr.: 25 ref
language
inglise
Piho, G., Tepandi, J., Parman, M., Puusep, V., Roost, M. Test driven domain modelling // MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings. [S.l.] : MIPRO, 2011. p. 576-581.