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ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan (source)
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1
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
2006
/
p. 437-442 : ill
http://dx.doi.org/10.1109/ATS.2006.23
book article
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