An external test approach for network-on-a-chip switches
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
source
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
location of publication
Washington
publisher
year of publication
pages
p. 437-442 : ill
conference name, date
15th Asian Test Symposium, November 20-23, 2006
conference location
Fukuoka, Japan
ISBN
0-7695-2628-4
notes
Bibliogr.: 14 ref
TTÜ department
language
inglise
subject term
Raik, J., Govind, V., Ubar, R.-J. An external test approach for network-on-a-chip switches // ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan. Washington : IEEE Computer Society, 2006. p. 437-442 : ill.