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Comprehensive performance and robustness analysis of 2D turn models for network-on-chips (title)
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book article EST
/
book article ENG
Comprehensive performance and robustness analysis of 2D turn models for network-on-chips
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Kogge, Thilo
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 IEEE International Symposium on Circuits and Systems (ISCAS)
2017
/
p. 1476-1479 : ill
https://doi.org/10.1109/ISCAS.2017.8050634
Conference proceedings at Scopus
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book article EST
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book article ENG
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