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Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation (title)
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book article EST
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book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
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book article EST
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keyword
4
1.
data-controlled segmentation
2.
deterministic and pseudo-exhaustive tests
3.
pseudo-exhaustive test
4.
two-dimensional array testing
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