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Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation

author
statement of authorship
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
source
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
location of publication
Piscataway
publisher
year of publication
pages
5 p.: ill
conference name, date
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May, 2018
conference location
Florence, Italy
url
ISBN
978-1-5386-4881-0
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Oyeniran, A.S., Azad, S.P., Ubar, R.-J. Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation // 2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings. Piscataway : IEEE, 2018. 5 p.: ill. https://doi.org/10.1109/ISCAS.2018.8350936