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Journal of electronic testing : theory and applications (source)
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1
journal article
A new testability calculation method to guide RTL test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2005
/
1, p. 71-82 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
journal article
2
journal article
Design error diagnosis with re-synthesis in combinational circuits
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2003
/
1, p. 73-82 : ill
https://link.springer.com/article/10.1023/A:1021948013402
journal article
3
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
4
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
journal article
5
journal article
PSL assertion checking using temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2009
/
6, p. 289-300 : ill
https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf
journal article
Number of records 5, displaying
1 - 5
keyword
3
1.
inverse problem theory/applications
2.
inverse problems theory/applications
3.
courses on electronic testing and design
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