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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings (source)
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1
book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
Number of records 1, displaying
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keyword
2
1.
human resource and Strategy Europe 2020
2.
strategy Europe 2020
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