A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
author
Fieback, Moritz
Wu, Lizhou
statement of authorship
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
source
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
publisher
year of publication
pages
p. 792-797
conference name, date
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
conference location
Grenoble, France
subject term
ISBN
978-3-9819263-4-7
notes
Bibliogr.: 24 ref
TTÜ department
language
inglise
Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797.