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Implementation-independent test generation for a large class of faults in RISC processor modules (title)
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book article
Implementation-independent test generation for a large class of faults in RISC processor modules
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Raik, Jaan
;
Ubar, Raimund-Johannes
24th Euromicro Conference on Digital System Design (DSD)
2021
https://doi.org/10.1109/DSD53832.2021.00090
book article
Number of records 1, displaying
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keyword
5
1.
implementation-independent test generation
2.
Test Group Generation for Detecting Multiple Faults
3.
RISC processor testing
4.
Implementation-Independent Testing of Microprocessors
5.
processor-centric board test
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