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2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (source)
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book article EST
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book article ENG
Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
Selg, Hardi
;
Shibin, Konstantin
;
Tsertov, Anton
;
Jenihhin, Maksim
;
Ellervee, Peeter
;
Raik, Jaan
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2024
https://doi.org/10.1109/DFT63277.2024.10753541
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
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cross-layer fault tolerance
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fault tolerance
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fault-tolerance
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