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Number of records 23
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1

book article

Active redundancy in fault tolerance : A modular switch level solution with synchronous switchingShirodkar, Aditya; Banavath, Satish Naik; Chub, Andrii; Mandrioli, Riccardo; Ricco, Mattia2025 IEEE Seventh International Conference on DC Microgrids (ICDCM)2025 / 6 p https://doi.org/10.1109/ICDCM63994.2025.11144667 Article at Scopus Article at WOS

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book article EST / book article ENG

Active redundancy in isolated DC-DC converters : a modular solution for fault toleranceShirodkar, Aditya; Banavath, Satish Naik; Yadav, Neelesh; Chub, Andrii; Mandrioli, Riccardo2025 IEEE 19th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2025 / 5 p https://doi.org/10.1109/CPE-POWERENG63314.2025.11027280 Article at Scopus Article at WOS

book article EST / book article ENG
3

book article

Analysis and improvement of resilience for long short-term memory neural networksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Kuusik, Alar2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 4 p https://doi.org/10.1109/DFT59622.2023.10313559

book article
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
4

book article

AWAIT : an ultra-lightweight soft-error mitigation mechanism for network-on-chip linksJanson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, Jaan2018 13th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), Lille, France, July 9th-11th, 20182018 / p. 1-6 : ill https://doi.org/10.1109/ReCoSoC.2018.8449374

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5

book article

Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

book article
Related publications 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
6

book article

Cost-effective fault tolerance for CNNs using parameter vulnerability based hardening and pruningAhmadilivani, Mohammad Hasan; Mousavi, Seyedhamidreza; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim2024 IEEE 30th International Symposium on On-line Testing and Robust System Design (IOLTS) : IOLTS 2024 : July 03rd-05th 2024, Rennes, Brittany, France2024 / 7 p https://doi.org/10.1109/IOLTS60994.2024.10616072 Article at Scopus Article at WOS

book article
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
7

book article

Effect of PM parameters variability on the operation quantities of a wind generatorKallaste, Ants; Belahcen, Anouar; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 242-247 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194536

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journal article EST / journal article ENG

Event-based control for differentially flat systems: application to autonomous underwater vehicleKaldmäe, Arvo; Kotta, Ülle; Meurer, Christian; Simha, AshutoshIFAC-PapersOnLine2019 / p. 180-185 https://doi.org/10.1016/j.ifacol.2019.11.775 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG
9

journal article

Fault tolerance in integration interfaces of business softwareLemmik, Rivo; Karjust, Kristo; Otto, TaunoInternational Journal Of Scientific Knowledge (Computing and Information Technology) IJSK2014 / p. 35-43 : ill

journal article
10

journal article EST / journal article ENG

FESDA : fog-enabled secure data aggregation in smart grid IoT networkSaleem, Ahsan; Khan, Abid; Malik, Saif Ur Rehman; Pervaiz, Haris; Malik, Hassan; Alam, Masoom; Jindal, AnishIEEE Internet of Things Journal2020 / p. 6132-6142 https://doi.org/10.1109/JIOT.2019.2957314 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
11

book article

Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]Janson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, JaanBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600989

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book article EST / book article ENG

Hybrid DC–DC converters with topology morphing control and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Korkh, Oleksandr; Blinov, Andrei; Liivik, ElizavetaElectrimacs 2019 : Selected Papers, Vol. 12020 / p. 433-445 https://doi.org/10.1007/978-3-030-37161-6_33 Conference proceeding at Scopus Article at Scopus

book article EST / book article ENG
13

book article

IJTAG-compatible symptom-based SEU monitors for FPGA DNN acceleratorsCherezova, Natalia; Jenihhin, Maksim; Jutman, Artur2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)2024 / 6 p. : ill https://doi.org/10.1109/DTTIS62212.2024.10780417 Article at Scopus Article at WOS

book article
14

book article

NOC mapping and schedulingNikiforov, DenissInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 73-78 : ill

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15

book article

Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]Blinov, Andrei; Norrga, Staffan; Tibola, GabrielEPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications2015 / p. 1-9 : ill. [USB] http://dx.doi.org/10.1109/EPE.2015.7309190

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16

book article

RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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book article

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

book article
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journal article EST / journal article ENG

Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
19

book article

Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

book article
Related publications 1
- Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
20

journal article EST / journal article ENG

Systematic review of fault tolerant techniques in underwater sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, JaanSensors2021 / art. 3264 https://doi.org/10.3390/s21093264 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur
21

book article EST / book article ENG

Zero-memory-overhead clipping-based fault tolerance for LSTM deep neural networksParchekani, Bahram; Nazari, Samira; Ahmadilivani, Mohammad Hasan; Azarpeyvand, Ali; Raik, Jaan; Ghasempouri, Tara; Daneshtalab, Masoud37th IEEE International Symposium on Defect and Fault Tolerancein VLSI and Nanotechnology Systems, Harwell, Oxfordshire, Didcot, UK, October 8th - 10th, 20242024 / 4 p. : ill https://doi.org/10.1109/DFT63277.2024.10753533 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
22

journal article EST / journal article ENG

Topology-morphing photovoltaic microconverter with wide MPPT voltage window and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Zinchenko, Denys; Sidorov, VadimIEEE Access2020 / art. 9171332, p. 153941-153955 : ill https://doi.org/10.1109/ACCESS.2020.3017805 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
23

journal article EST / journal article ENG

Toward software-defined networking-based IoT frameworks : a systematic literature review, taxonomy, open challenges and prospectsSiddiqui, Shahbaz; Hameed, Sufian; Shah, Syed Attique; Aneiba, Adel; Draheim, Dirk; Dustdar, SchahramIEEE Access2022 / p. 70850-70901 https://doi.org/10.1109/ACCESS.2022.3188311 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Number of records 23, displaying 1 - 23

1. cross-layer fault tolerance
2. fault tolerance
3. fault-tolerance
4. sensor tolerance
5. thermal tolerance
6. tolerance
7. tolerance analysis
8. tourism tolerance
9. AI-based fault detection
10. asynchronous fault detection
11. automatic fault diagnosis
12. bearing fault diagnosis
13. bi-directional fault monitoring devices
14. conditional fault collapsing
15. control fault models
16. critical path fault tracing
17. cross-layered fault management
18. extended fault class
19. fault currents
20. fault analysis
21. fault analysis model
22. fault classification
23. fault classification
24. fault collapsing
25. fault compensation
26. fault coverage
27. fault current and voltage measurements
28. Fault current limite
29. fault current limiter
30. fault detection
31. fault detection and classification
32. fault detection and diagnoses
33. fault detection and diagnosis
34. fault detection and diagnostics (FDD)
35. fault diagnosis
36. fault diagnostic
37. fault diagnostic resolution
38. fault diagnostics
39. fault dignosis
40. fault effects
41. fault emulation
42. fault equivalence and dominance
43. fault handling
44. fault handling strategy
45. fault indicator
46. fault injection
47. Fault Injection Simulation
48. fault Interruption
49. fault localization
50. fault location
51. fault management
52. fault masking
53. fault modeling
54. fault models
55. fault monitoring
56. fault prediction
57. fault protection
58. fault redundancy
59. fault resilience
60. fault ride through
61. Fault ride through enhancement
62. fault signal
63. fault simulastion
64. fault simulation
65. fault simulation with critical path tracing
66. fault tolerant
67. fault tolerant control
68. fault tolerant operation
69. fault tolerant router design
70. fault tolerant systems
71. fault tree analysis
72. fault-injection attack
73. fault-plane solution
74. fault-resilience
75. fault-resistant
76. fault-ride-through (FRT)
77. fault-tolerant
78. Fault-tolerant (FT) converters
79. fault-tolerant control
80. fault-tolerant converter
81. functional fault model
82. high-level control fault model
83. high-level fault coverage
84. high-level fault model
85. high-level fault simulation
86. high-level functional fault model
87. hybrid fault detection
88. Katun fault
89. low-level fault redundancy
90. no fault found
91. No-Fault-Found
92. open circuit fault
93. Parallel Fault Simulation with Critical Path Backtracing
94. parallel fault-simulation
95. photovoltaic fault detection algorithms
96. PV fault classification
97. short circuit fault
98. spectrum-based fault localization
99. stacking fault
100. stuck-at fault model
101. test generation and fault diagnosis
102. transient fault mitigation
103. transmission lines fault

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