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KunstninaKasemaa, ArgoElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 95-102 : ill https://www.ester.ee/record=b1399956*est

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52

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Laboratory works in semiconductor electronicsVodovozov, Valery; Raud, Zoja2016 http://www.ester.ee/record=b4775549*est

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53

book article

Laia keelutsooniga pooljuhtmaterjalidel põhinevad pooljuhtseadisedRang, Toomas; Rang, GalinaTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 169-176 : ill., fot https://www.ester.ee/record=b5208765*est

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54

book article

LPE structures for power GaAs rectifiersVoitovitš, ViktorThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 237-240 : ill https://artiklid.elnet.ee/record=b1005558*est

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55

journal article EST / journal article ENG

The MAPS foilBeole, S.; Carnesecchi, F.; Contin, Giacomo; de Oliveira, Rui A.Negrao; Di Mauro, Antonello; Ferry, Serge; Hillemanns, Hartmut; Junique, Antoine; Kluge, Alexander; Lautner, Lukas; Mager, Magnus; Mehl, Bertrand; Rebane, Karoliina; Reidt, Felix; Sanna, I.; Šuljić, M.; Yüncü, AlperenNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment2023 / art. 167673 https://doi.org/10.1016/j.nima.2022.167673 Journal metrics at Scopus Article at Scopus

journal article EST / journal article ENG

56

book article

Metallization technologies for wide band-gap semiconductor substrates : (invited paper)Rang, Toomas; Korolkov, Oleg; Pikkov, MihhailProceedings of the 6th Nexuspan Workshop Microsystems Technology Activities in Baltic Region : 23-24 April, 1999, Vilnius, Lithuania1999 / p. 27-30

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57

book article

A method for identification dynamic parameters of mixed signal circuitsZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 211-215 https://www.ester.ee/record=b2150914*est

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58

book

Mikroskeemsed ja transistormodulaatorid : raadiosaateseadmete laboratoorsed tööd. III vihik1988 https://www.ester.ee/record=b1224917*est

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59

dissertation

Modeling and simulation of bipolar semiconductor devices : authors's main publicationsVelmre, Enn1996 http://www.ester.ee/record=b2079366*est

dissertation

60

book

Modeling in semiconductor electronicsJavor, A.; Rang, Toomas; Szekely, V.; Tarnay, K.; Velmre, Enn1993 https://www.ester.ee/record=b1031052*est

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61

book article

Modeling in semiconductor electronicsVelmre, Enn; Rang, ToomasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 501-516: ill https://www.ester.ee/record=b2150914*est

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62

journal article

Modelling of charge carrier non-isothermal transport in silicon and silicon carbideVelmre, Enn; Udal, AndresProceedings of the Estonian Academy of Sciences. Engineering2000 / 2, p. 144-154 : ill https://artiklid.elnet.ee/record=b1004044*est

journal article

63

dissertation

New converter topologies for integration of hydrogen based long-term energy storages to renewable energy systems = Uued muundurite topoloogiad vesinikul põhinevate energiasalvestite integreerimiseks taastuvenergiasüsteemidesseAndrijanovitš, Anna2013 http://www.ester.ee/record=b2946972*est

dissertation

64

book article

Non-destructive eddy current measurments for silicon carbide heterostructure analysisSahakyan, Armen; Koel, Ants; Rang, ToomasMaterials and contact characterisation VIII2017 / p. 49-60 : ill http://dx.doi.org/10.2495/MC170061

book article

65

book article

Nonisothermal numerical simulation of semiconductor power devicesVelmre, Enn; Udal, AndresAutomation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 139-145: ill

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66

book article

Numerical simulation of photoelectric processes in semiconductor devicesKucherenko, S.S.; Kudryashov, N.A.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 101-106: ill

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67

book article

Numerical simulations of wideband SiC N-N heterostructure diodePatankar, Udayan Sunil; Koel, Ants; Pardy, TamasLAEDC 2020 : Latin American Electron Devices Conference, San José, Costa Rica, February 25-28, 20202020 / 4 p https://doi.org/10.1109/LAEDC49063.2020.9073489

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68

book article

Numerical study of current crowding phenomenon in complementary 4H-SiC JBS rectifiersRang, Toomas; Higelin, G.; Kurel, RaidoSilicon Carbide and Related Materials 20032004 / p. 1045-1048 https://www.scientific.net/MSF.457-460.1045

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69

book article

Numerical study of turn-off phenomenon in complementary 4H-SiC JBS rectifiersRang, Toomas; Kurel, Raido; Higelin, G.BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 47-50 : ill

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70

journal article

On the charge carrier time-of-flight mobility and the ordering effects in the microcrystalline PEDOT/PSS complex : a morphology-based simulation studyKaevand, Toomas; Kalda, Jaan; Lille, ÜloInternational journal of renewable energy and biofuels2013 / p. 1-13 : ill

journal article

71

journal article

On the design process of a 6-kVA quasi-Z-inverter employing SiC power devicesZdanowski, Mariusz; Peftitsis, Dimosthenis; Piasecki, Szymon; Rabkowski, JacekIEEE transactions on power electronics2016 / p. 7499-7508 : ill https://doi.org/10.1109/TPEL.2016.2527100

journal article

72

book article

1200 V RB-IGBTs under different switching conditionsKorkh, Oleksandr18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 149-150 : ill

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73

book article

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342

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74

book article

Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]Blinov, Andrei; Norrga, Staffan; Tibola, GabrielEPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications2015 / p. 1-9 : ill. [USB] http://dx.doi.org/10.1109/EPE.2015.7309190

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75

book article

Parametric simulation of SiC Schottky JBC structuresRang, Toomas; Kurel, RaidoComputer methods and experimental measurements for surface effects and contact mechanics VIII2007 / p. 315-334 https://www.witpress.com/Secure/elibrary/papers/SECM07/SECM07030FU1.pdf

book article

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