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Generalization of longitudinal-lateral scheme for two-dimensional transient semiconductor device simulation (title)
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book article
Generalization of longitudinal-lateral scheme for two-dimensional transient semiconductor device simulation
Gunko, V.B.
;
Kucherenko, S.S.
;
Kudryashov, N.A.
;
Sytsko, Yu.I.
Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool
1992
/
p. 107-112: ill
https://www.ester.ee/record=b1064031*est
book article
Number of records 1, displaying
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keyword
7
1.
power semiconductor device
2.
semiconductor device failure
3.
semiconductor device manufacture
4.
semiconductor device measurement
5.
semiconductor device modeling
6.
Semiconductor device packaging
7.
semiconductor device reliability
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