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FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Related publications 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article EST / journal article ENG

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device failure
4. semiconductor device manufacture
5. semiconductor device modeling
6. Semiconductor device packaging
7. semiconductor device reliability
8. device-to-device (D2D)
9. device-to-device (D2D) communication
10. device-to-device communication
11. cardiac device therapy
12. cooling device performance
13. Counter Improvised Explosive Device (C-IED)
14. device
15. device capacity
16. device characterisation
17. Device characterization
18. device modeling
19. device therapy
20. Discrete power device
21. energy saving device (ESD)
22. energy storage device
23. implantable medical device
24. Improvised Explosive Device (IED)
25. low-power device
26. massive device connectivity
27. medical device
28. metal semiconductor contacts
29. metal-oxide-semiconductor field-effect transistors (MOSFETs)
30. microfluidic device
31. motion-reduction device
32. on-device transfer learning
33. plasma-focus device
34. power semiconductor devices
35. power semiconductor switches
36. projected device density of states (PDDOS)
37. p-type transparent semiconductor
38. Real device
39. robotic device
40. semiconductor
41. semiconductor band bending
42. semiconductor crystals
43. semiconductor devices
44. semiconductor diodes
45. semiconductor doping
46. semiconductor heterojunctions
47. semiconductor technology
48. Semiconductor/electrolyte contact
49. semiconductor-metal transition
50. storage device
51. Superconducting device noise
52. Wearable device
53. wide band gap semiconductor devices
54. advanced measurement infrastructure
55. angle measurement
56. atmospheric measurement uncertainty
57. bioimpedance measurement
58. blood pressure measurement
59. blood sugar measurement
60. business school learning rate measurement instrument
61. characteristics of phasor measurement units
62. concentration measurement
63. Contactless conductivity measurement
64. continuous measurement
65. corrosion measurement
66. current measurement
67. differential measurement
68. distribution-level phasor measurement units (D-PMUs)
69. driving dynamics measurement
70. DTS measurement
71. dynamic measurement feedback
72. effect measurement
73. efficiency measurement
74. electric impedance measurement
75. electrical resistance measurement
76. electron density measurement
77. electronic measurement
78. employees' performance measurement
79. experimental measurement
80. filter transmission measurement
81. flow measurement
82. force measurement
83. four-electrode impedance measurement
84. frequency measurement
85. harmonic measurement
86. high speed measurement
87. hygrothermal measurement and modelling
88. impedance measurement
89. impedance spectrum measurement
90. Inerial Measurement Unit (IMU)
91. inertial measurement unit
92. inertial measurement unit (IMU)
93. input/output current measurement
94. light measurement
95. lock-in measurement
96. loss measurement
97. losses measurement
98. magnetic measurement
99. maximum permissible error (deviation) of measurement result
100. measurement
101. measurement accuracy
102. measurement and testing
103. measurement by CCD cameras
104. measurement campaign
105. measurement coil
106. measurement error in household surveys
107. Measurement errors
108. measurement feedback
109. measurement gaps
110. measurement model
111. measurement standards
112. measurement uncertainty
113. measurement units
114. micro characterization and surface roughness measurement
115. mooring measurement
116. network measurement
117. non-contact optical measurement
118. non-invasive measurement
119. optical variables measurement
120. organizational learning measurement instruments
121. organizational learning rate measurement
122. partial discharge measurement
123. passive measurement
124. perfomance measurement
125. performance measurement
126. performance measurement system
127. phasor measurement
128. phasor measurement unit
129. Phasor measurement unit (PMU)
130. phasor measurement units
131. pollution measurement
132. position measurement
133. power measurement
134. power quality measurement
135. power quality measurement equipment
136. quality performance measurement
137. radiated EMI measurement
138. real-time measurement
139. road condition measurement
140. road performance measurement
141. single far-field measurement
142. single measurement
143. single-molecule measurement
144. Spectrophotometric measurement
145. static measurement feedback
146. synchronous measurement
147. temperature measurement
148. testing of phasor measurement units
149. Time measurement
150. torque measurement
151. tracer-gas measurement
152. tyre velocity measurement
153. wave height measurement
154. wave measurement
155. wear measurement
156. vibration measurement
157. voltage measurement

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