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semiconductor device measurement (keyword)
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1
book article
FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedance
Priidel, Eiko
;
Pesti, Ksenija
;
Min, Mart
;
Ojarand, Jaan
;
Märtens, Olev
2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings
2021
/
5 p. : ill
https://doi.org/10.1109/I2MTC50364.2021.9460073
book article
Related publications
1
Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2
journal article
Impact of orientation on the bias of SRAM-based PUFs
Abideen, Zain Ul
;
Wang, Rui
;
Perez, Tiago Diadami
;
Schrijen, Geert-Jan
;
Pagliarini, Samuel Nascimento
IEEE design & test
2024
/
p. 14-20
https://doi.org/10.1109/MDAT.2023.3322621
journal article
Related publications
1
Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina
Number of records 2, displaying
1 - 2
keyword
154
1.
semiconductor device measurement
2.
power semiconductor device
3.
semiconductor device manufacture
4.
semiconductor device modeling
5.
semiconductor device reliability
6.
device-to-device (D2D)
7.
device-to-device (D2D) communication
8.
device-to-device communication
9.
cardiac device therapy
10.
cooling device performance
11.
Counter Improvised Explosive Device (C-IED)
12.
device
13.
device capacity
14.
device characterisation
15.
Device characterization
16.
device modeling
17.
device therapy
18.
Discrete power device
19.
energy saving device (ESD)
20.
energy storage device
21.
implantable medical device
22.
Improvised Explosive Device (IED)
23.
low-power device
24.
massive device connectivity
25.
medical device
26.
metal semiconductor contacts
27.
metal-oxide-semiconductor field-effect transistors (MOSFETs)
28.
microfluidic device
29.
motion-reduction device
30.
on-device transfer learning
31.
plasma-focus device
32.
power semiconductor devices
33.
power semiconductor switches
34.
projected device density of states (PDDOS)
35.
p-type transparent semiconductor
36.
Real device
37.
robotic device
38.
semiconductor
39.
semiconductor band bending
40.
semiconductor crystals
41.
semiconductor devices
42.
semiconductor diodes
43.
semiconductor doping
44.
semiconductor heterojunctions
45.
semiconductor technology
46.
Semiconductor/electrolyte contact
47.
semiconductor-metal transition
48.
storage device
49.
Superconducting device noise
50.
Wearable device
51.
wide band gap semiconductor devices
52.
advanced measurement infrastructure
53.
angle measurement
54.
bioimpedance measurement
55.
blood pressure measurement
56.
blood sugar measurement
57.
business school learning rate measurement instrument
58.
characteristics of phasor measurement units
59.
concentration measurement
60.
Contactless conductivity measurement
61.
continuous measurement
62.
corrosion measurement
63.
current measurement
64.
differential measurement
65.
distribution-level phasor measurement units (D-PMUs)
66.
driving dynamics measurement
67.
DTS measurement
68.
dynamic measurement feedback
69.
effect measurement
70.
efficiency measurement
71.
electric impedance measurement
72.
electrical resistance measurement
73.
electron density measurement
74.
electronic measurement
75.
employees' performance measurement
76.
experimental measurement
77.
filter transmission measurement
78.
flow measurement
79.
force measurement
80.
four-electrode impedance measurement
81.
frequency measurement
82.
harmonic measurement
83.
high speed measurement
84.
hygrothermal measurement and modelling
85.
impedance measurement
86.
impedance spectrum measurement
87.
Inerial Measurement Unit (IMU)
88.
inertial measurement unit
89.
inertial measurement unit (IMU)
90.
input/output current measurement
91.
light measurement
92.
lock-in measurement
93.
loss measurement
94.
losses measurement
95.
magnetic measurement
96.
maximum permissible error (deviation) of measurement result
97.
measurement
98.
measurement accuracy
99.
measurement and testing
100.
measurement by CCD cameras
101.
measurement campaign
102.
measurement coil
103.
measurement error in household surveys
104.
Measurement errors
105.
measurement feedback
106.
measurement gaps
107.
measurement model
108.
measurement standards
109.
measurement uncertainty
110.
measurement units
111.
micro characterization and surface roughness measurement
112.
mooring measurement
113.
network measurement
114.
non-contact optical measurement
115.
non-invasive measurement
116.
optical variables measurement
117.
organizational learning measurement instruments
118.
organizational learning rate measurement
119.
partial discharge measurement
120.
passive measurement
121.
perfomance measurement
122.
performance measurement
123.
performance measurement system
124.
phasor measurement
125.
phasor measurement unit
126.
Phasor measurement unit (PMU)
127.
phasor measurement units
128.
pollution measurement
129.
position measurement
130.
power measurement
131.
power quality measurement
132.
power quality measurement equipment
133.
quality performance measurement
134.
radiated EMI measurement
135.
real-time measurement
136.
road condition measurement
137.
road performance measurement
138.
single far-field measurement
139.
single measurement
140.
single-molecule measurement
141.
Spectrophotometric measurement
142.
static measurement feedback
143.
synchronous measurement
144.
temperature measurement
145.
testing of phasor measurement units
146.
Time measurement
147.
torque measurement
148.
tracer-gas measurement
149.
tyre velocity measurement
150.
wave height measurement
151.
wave measurement
152.
wear measurement
153.
vibration measurement
154.
voltage measurement
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