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book article

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

journal article
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device manufacture
4. semiconductor device modeling
5. semiconductor device reliability
6. device-to-device (D2D)
7. device-to-device (D2D) communication
8. device-to-device communication
9. cardiac device therapy
10. cooling device performance
11. Counter Improvised Explosive Device (C-IED)
12. device
13. device capacity
14. device characterisation
15. Device characterization
16. device modeling
17. device therapy
18. Discrete power device
19. energy saving device (ESD)
20. energy storage device
21. implantable medical device
22. Improvised Explosive Device (IED)
23. low-power device
24. massive device connectivity
25. medical device
26. metal semiconductor contacts
27. metal-oxide-semiconductor field-effect transistors (MOSFETs)
28. microfluidic device
29. on-device transfer learning
30. plasma-focus device
31. power semiconductor devices
32. power semiconductor switches
33. projected device density of states (PDDOS)
34. p-type transparent semiconductor
35. Real device
36. robotic device
37. semiconductor
38. semiconductor band bending
39. semiconductor crystals
40. semiconductor devices
41. semiconductor diodes
42. semiconductor doping
43. semiconductor heterojunctions
44. semiconductor technology
45. Semiconductor/electrolyte contact
46. semiconductor-metal transition
47. storage device
48. Superconducting device noise
49. Wearable device
50. wide band gap semiconductor devices
51. advanced measurement infrastructure
52. angle measurement
53. bioimpedance measurement
54. blood pressure measurement
55. blood sugar measurement
56. business school learning rate measurement instrument
57. characteristics of phasor measurement units
58. concentration measurement
59. Contactless conductivity measurement
60. continuous measurement
61. corrosion measurement
62. current measurement
63. differential measurement
64. distribution-level phasor measurement units (D-PMUs)
65. driving dynamics measurement
66. DTS measurement
67. dynamic measurement feedback
68. effect measurement
69. efficiency measurement
70. electrical resistance measurement
71. electron density measurement
72. electronic measurement
73. employees' performance measurement
74. experimental measurement
75. filter transmission measurement
76. flow measurement
77. force measurement
78. four-electrode impedance measurement
79. frequency measurement
80. harmonic measurement
81. high speed measurement
82. impedance measurement
83. impedance spectrum measurement
84. Inerial Measurement Unit (IMU)
85. inertial measurement unit
86. inertial measurement unit (IMU)
87. input/output current measurement
88. light measurement
89. lock-in measurement
90. loss measurement
91. losses measurement
92. magnetic measurement
93. maximum permissible error (deviation) of measurement result
94. measurement
95. measurement accuracy
96. measurement and testing
97. measurement by CCD cameras
98. measurement campaign
99. measurement coil
100. measurement error in household surveys
101. Measurement errors
102. measurement feedback
103. measurement gaps
104. measurement model
105. measurement standards
106. measurement uncertainty
107. measurement units
108. micro characterization and surface roughness measurement
109. mooring measurement
110. network measurement
111. non-contact optical measurement
112. non-invasive measurement
113. optical variables measurement
114. organizational learning measurement instruments
115. organizational learning rate measurement
116. partial discharge measurement
117. passive measurement
118. perfomance measurement
119. performance measurement
120. performance measurement system
121. phasor measurement
122. phasor measurement unit
123. Phasor measurement unit (PMU)
124. phasor measurement units
125. pollution measurement
126. position measurement
127. power measurement
128. power quality measurement
129. power quality measurement equipment
130. quality performance measurement
131. radiated EMI measurement
132. real-time measurement
133. road condition measurement
134. road performance measurement
135. single far-field measurement
136. single measurement
137. single-molecule measurement
138. Spectrophotometric measurement
139. static measurement feedback
140. synchronous measurement
141. temperature measurement
142. testing of phasor measurement units
143. Time measurement
144. torque measurement
145. tracer-gas measurement
146. tyre velocity measurement
147. wave height measurement
148. wave measurement
149. wear measurement
150. vibration measurement
151. voltage measurement

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