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book article

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

book article
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

journal article

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

journal article
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Number of records 2, displaying 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device manufacture
4. semiconductor device modeling
5. semiconductor device reliability
6. device-to-device (D2D)
7. device-to-device (D2D) communication
8. device-to-device communication
9. cardiac device therapy
10. cooling device performance
11. Counter Improvised Explosive Device (C-IED)
12. device
13. device capacity
14. device characterisation
15. Device characterization
16. device modeling
17. Discrete power device
18. energy saving device (ESD)
19. energy storage device
20. implantable medical device
21. Improvised Explosive Device (IED)
22. low-power device
23. massive device connectivity
24. medical device
25. metal semiconductor contacts
26. metal-oxide-semiconductor field-effect transistors (MOSFETs)
27. microfluidic device
28. on-device transfer learning
29. plasma-focus device
30. power semiconductor devices
31. power semiconductor switches
32. projected device density of states (PDDOS)
33. p-type transparent semiconductor
34. Real device
35. robotic device
36. semiconductor
37. semiconductor band bending
38. semiconductor crystals
39. semiconductor devices
40. semiconductor diodes
41. semiconductor doping
42. semiconductor heterojunctions
43. semiconductor technology
44. Semiconductor/electrolyte contact
45. semiconductor-metal transition
46. storage device
47. Superconducting device noise
48. Wearable device
49. wide band gap semiconductor devices
50. advanced measurement infrastructure
51. angle measurement
52. bioimpedance measurement
53. blood sugar measurement
54. business school learning rate measurement instrument
55. characteristics of phasor measurement units
56. concentration measurement
57. Contactless conductivity measurement
58. continuous measurement
59. corrosion measurement
60. current measurement
61. differential measurement
62. distribution-level phasor measurement units (D-PMUs)
63. driving dynamics measurement
64. DTS measurement
65. dynamic measurement feedback
66. effect measurement
67. efficiency measurement
68. electrical resistance measurement
69. electron density measurement
70. electronic measurement
71. employees' performance measurement
72. experimental measurement
73. filter transmission measurement
74. flow measurement
75. force measurement
76. four-electrode impedance measurement
77. frequency measurement
78. harmonic measurement
79. high speed measurement
80. impedance measurement
81. impedance spectrum measurement
82. inertial measurement unit
83. inertial measurement unit (IMU)
84. input/output current measurement
85. light measurement
86. lock-in measurement
87. loss measurement
88. losses measurement
89. magnetic measurement
90. maximum permissible error (deviation) of measurement result
91. measurement
92. measurement accuracy
93. measurement and testing
94. measurement by CCD cameras
95. measurement campaign
96. measurement coil
97. measurement error in household surveys
98. Measurement errors
99. measurement feedback
100. measurement gaps
101. measurement model
102. measurement standards
103. measurement uncertainty
104. measurement units
105. micro characterization and surface roughness measurement
106. mooring measurement
107. network measurement
108. non-contact optical measurement
109. non-invasive measurement
110. optical variables measurement
111. organizational learning measurement instruments
112. organizational learning rate measurement
113. partial discharge measurement
114. passive measurement
115. perfomance measurement
116. performance measurement
117. performance measurement system
118. phasor measurement
119. phasor measurement unit
120. Phasor measurement unit (PMU)
121. phasor measurement units
122. pollution measurement
123. position measurement
124. power measurement
125. power quality measurement
126. power quality measurement equipment
127. quality performance measurement
128. radiated EMI measurement
129. real-time measurement
130. road condition measurement
131. road performance measurement
132. single far-field measurement
133. single measurement
134. single-molecule measurement
135. Spectrophotometric measurement
136. static measurement feedback
137. synchronous measurement
138. temperature measurement
139. testing of phasor measurement units
140. Time measurement
141. torque measurement
142. tracer-gas measurement
143. tyre velocity measurement
144. wave height measurement
145. wave measurement
146. wear measurement
147. vibration measurement
148. voltage measurement

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