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A critical study of semiconductor device simulation methods (title)
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book article
A critical study of semiconductor device simulation methods
Tarnay, K.
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 9-16: ill
book article
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keyword
13
1.
power semiconductor device
2.
semiconductor device failure
3.
semiconductor device manufacture
4.
semiconductor device measurement
5.
semiconductor device modeling
6.
Semiconductor device packaging
7.
semiconductor device reliability
8.
fault simulation with critical path tracing
9.
Parallel Fault Simulation with Critical Path Backtracing
10.
device-to-device (D2D)
11.
device-to-device (D2D) communication
12.
device-to-device communication
13.
methods of study
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