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Exact static compaction of sequential circuit tests using branch-and-bound and search state registration (title)
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book article
Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 19-20
https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration
book article
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keyword
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branch and bound
2.
greedy and branch & bound algorithms
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