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3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers (source)
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book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
https://dblp.org/rec/conf/latw/Ubar02.html
book article
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