Testability calculation for digital circuits with decision diagrams
author
statement of authorship
Raimund Ubar
source
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
location of publication
[S.l.]
year of publication
pages
p. 137-143 : ill
notes
Bibliogr.: 13 ref
Ubar, R.-J. Testability calculation for digital circuits with decision diagrams // 3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers. [S.l.], 2002. p. 137-143 : ill.