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Explorations in low area overhead DfT techniques for sequential BIST (title)
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book article
Explorations in low area overhead DfT techniques for sequential BIST
Raik, Jaan
;
Raidma, Rein
;
Ubar, Raimund-Johannes
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 220-223 : ill
book article
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user in low voltage area
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