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Point defects interaction with extended defects and impurities and its influence on the Si-SiO2 system properties (title)
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book article
Point defects interaction with extended defects and impurities and its influence on the Si-SiO2 system properties
Kropman, Daniel
;
Arbu, Uno
;
Kärner, T.
;
Ugaste, Ülo
;
Mellikov, Enn
;
Kauk, Marit
;
Heinmaa, I.
;
Samoson, Ago
;
Medvid, A.
Gettering and defect engineering in semiconductor technology. XI
2005
/
p. 333-338 : ill
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties
book article
Number of records 1, displaying
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keyword
21
1.
point defects
2.
Si-SiO2 system
3.
Si-SiO2 interface
4.
Si-SiO2-Si3N4 interface
5.
axial defects
6.
building defects
7.
critical-sized bone defects
8.
critical-sized defects
9.
Deep defects
10.
defects
11.
insulation defects
12.
interface defects
13.
material defects
14.
non-defects
15.
pavement defects
16.
physical defects
17.
radiation defects
18.
segmental bone defects
19.
segmental femoral and tibial defects
20.
segmental long bone defects
21.
structural defects
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