LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru (source)

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    Fault diagnosis in the BIST environment based on bisection of detected faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru2007 / [6] p. : ill
    book article
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